China Supplier High Precision Automatic Solar Photovoltaic Junction Box Tester

• Customization: Available
• Type: Universal Testing Machine
• Accuracy Grade: 1
• Model NO.: EPFR-908
• Display: LCD
• Control: Computer Control
• Weight: 0-100Kg
• Power Source: AC220V
• If: Forward Pressure Drop Test: 0.1mA-30A
• Vf: Forward Pressure Drop Test: 1mv-2V Resolution: 1mv
• Vf Accuracy: 1%+-1 Digit
• Reverse Leakage Current Test: Vr: 5-300V
• IR: 1ua-2mA
• Resolution: 1ua
• IR Accuracy: 2%+-1 Digit
• Breakdown Voltage Test: Vr: 5-300V
• IR1: 01-10mA
• Breakdown Voltage Test Accuracy: 1%
• Breakdown Voltage Error Test: Vr: 0.5-300V
• IR1:Breakdown Voltage Error Test: 0.1-10mA
• Accuracy: Breakdown Voltage Error Test: 1%
• Wiring Resistance Test: Test Current Is The Same as If
• Rj Resolution: 0.1mohm
• Transport Package: Plywood Case with Foam Inside
• Trademark: EP Hipot Electric
• Origin: China
• HS Code: 9030100000
• Production Capacity: 1000/Year

Product Description

General Information:
Fully automatic solar photovoltaic junction box tester, which can test the conduction of the junction box and the forward voltage drop VF, reverse leakage current IR, breakdown voltage VR, breakdown voltage difference δVR and conduction of each diode at one time DC resistance RJ and other parameters of the junction box test instrument. Can meet the requirements of 20-300W junction box (1 to 6 diodes) test, and display the measurement parameters of each diode, automatically judge the junction box is qualified or unqualified. When the unqualified junction box is detected, the instrument automatically alarms, and the instrument displays the position of the unqualified diode and the parameters of the unqualified device. It is widely used in junction box manufacturers and photovoltaic module manufacturers to test the electrical performance parameters of junction boxes, in order to improve the passing rate of junction box products and the quality of products.

Features:

• Use DSP control, intelligent test. Using high-speed A/D converter, the test conversion is completed within 1ms, so as to achieve rapid testing.
• The linear power supply is adopted, and the voltage and current stabilization time are within 1ms, while the testers using switching power supply are above 200ms. High-speed testing, so the test data more accurately reflects the true performance of the tested product, avoiding drift caused by long-term loading.
• Multi-function, this machine is a fully automatic tester, which can simulate full automatic and automatic test. Completely avoid the leakage of the diode, open the junction box, short circuit, unqualified, damaged, reversed polarity and poor welding and other unqualified junction box accurate judgment.
• The instrument adopts Kelvin four-terminal test, which effectively eliminates the influence of lead resistance and contact resistance on the measurement results. It can measure the normal temperature values of VF, IR, VR, and δVR, as well as the high temperature values of VF, IR, VR, and δVR. And display the amount of change in normal and high temperature test values. No additional heating equipment is required for high temperature measurement. The method is to test the VF, IR and VDR of the diode at room temperature, apply a super-stable rated current to the diode for a few seconds, so that the diode junction temperature quickly approaches or reaches the maximum allowable junction temperature TjM, and then immediately detect VF, IR , VDR high temperature value and the amount of change between normal temperature and high temperature value, using diode thermal parameters as failure criteria, to exclude thermal instability diodes such as large thermal resistance, instantaneous thermal open circuit, high temperature leakage current and so on.
• Full English interface, easy to operate.
• The test conditions and judgment data of the device can be edited and 20 sets of data can be saved in the system and can be modified. Easy to call during testing. The same model can be continuously tested, and whether the device under test is automatically identified in the test port.
• Automatically detect the normal temperature value of the diodes VF, IR, VR, Δvr, and the temperature rise of the through-current test. The through-flow temperature rise test can measure the change of normal temperature and high temperature, and test all the parameters of each diode. The entire process of each junction box is completed at once. If only the normal temperature parameters are measured, each diode only takes about 0.1 second. At the end of the test, all measurement data will be displayed; the junction box will automatically alarm if the device fails, and clearly display the failure information.
• Conduction DC resistance test, you can judge whether the lead of the junction box is short core and reliable riveting by the resistance value of the test wire.

 

Technical Specifications:

Forward pressure drop test	IF: 0.1mA-30A VF: 1mV-2V resolution: 1mV VF accuracy: 1%±1 digit
Reverse leakage current test	VR: 5-300V IR: 1uA-2mA resolution: 1uA IR accuracy: 2%±1 digit
Breakdown voltage test	VR: 5-300V IR1:01-10mA Accuracy: 1%
Breakdown voltage error test	VR: 0.5-300V IR1:0.1-10mA Accuracy: 1%
Wiring resistance test	Test current is the same as IF RJ resolution 0.1mΩ Accuracy: 1%
Prompt	Prompt for reverse connection or damage of the diode.
Working power	220V±10% 50Hz

More details on Solar photovoltaic junction box tester EPFR-908 please contact EPHipot Electric, we have professional tech team to design correctly designed products and systems.